Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
polarization
nir
lithium niobate
optical coherence tomography
Journals >
Laser & Optoelectronics Progress >
Volume 55 >
Issue 9 >
Page 91001 > Article
Laser & Optoelectronics Progress
Vol. 55, Issue 9, 91001 (2018)
An Dynamic Strain Subset Selection Algorithm in Digital Image Correlation Method
Wang Ying, Shen Huan, Xia Hansheng, and Liu Dunqiang
Author Affiliations
[in Chinese]
show less
DOI:
10.3788/lop55.091001
Cite this Article
Set citation alerts
Wang Ying, Shen Huan, Xia Hansheng, Liu Dunqiang. An Dynamic Strain Subset Selection Algorithm in Digital Image Correlation Method[J]. Laser & Optoelectronics Progress, 2018, 55(9): 91001
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 21, 2024
Citation counts are provided from Researching.
The article is cited by
3
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (0)
Equations (0)
References (21)
Cited By (3)
Get Citation
Copy Citation Text
Wang Ying, Shen Huan, Xia Hansheng, Liu Dunqiang. An Dynamic Strain Subset Selection Algorithm in Digital Image Correlation Method[J]. Laser & Optoelectronics Progress, 2018, 55(9): 91001
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Image Processing
Received: Jan. 12, 2018
Accepted: --
Published Online: Apr. 2, 2018
The Author Email:
DOI:
10.3788/lop55.091001
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm