Electric field probe calibration and improvement method based on open TEM cell

Haoyan Wang; Junna Li; Yuhan Gong; Jian Liu

doi:10.11884/HPLPB202234.210461

Journals >High Power Laser and Particle Beams >Volume 34 >Issue 9 >Page 093002 > Article

High Power Laser and Particle Beams
Vol. 34, Issue 9, 093002 (2022)

Electric field probe calibration and improvement method based on open TEM cell

Haoyan Wang, Junna Li^*, Yuhan Gong, and Jian Liu

Author Affiliations

Xi’an Jiaotong University, School of Electrical Engineering, Xi’an 710049

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DOI: 10.11884/HPLPB202234.210461 Cite this Article

Haoyan Wang, Junna Li, Yuhan Gong, Jian Liu. Electric field probe calibration and improvement method based on open TEM cell[J]. High Power Laser and Particle Beams, 2022, 34(9): 093002 Copy Citation Text

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Fig. 1. Open TEM cell

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Fig. 2. Electric field waveforms at h=1 mm and h=148 mm when d=149 mm

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Fig. 3. S₂₁ parameters and S₁₁ parameters

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Fig. 4. Model with the probe

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Fig. 5. Fitting curve of error withh

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Fig. 6. TEM cell with improved structure

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Fig. 7. S₂₁ and S₁₁ parameters of improved structure

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measuring point/mm	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%
measuring point/mm	d=149 mm		d=199 mm		d=249 mm		d=299 mm
(0,0, 1)	68843	2.56	51550	2.59	41207	2.60	34334	2.66
(0,0, 40)	68197	1.61	51313	2.11	41065	2.25	34184	2.21
(0,0, 80)	66901	0.32	50671	0.84	40887	1.81	34032	1.76
(0,0, 120)	65741	1.77	49910	0.46	40223	0.15	33775	0.99
(0,0, 160)	—	—	49318	1.86	39891	0.67	33401	0.12
(0,0, 200)	—	—	—	—	39573	1.46	33063	1.14
(0,0, d-1)	65501	2.40	49106	2.28	39199	2.40	32623	2.45

Table 1. Electric field distribution and error

insulation size	measuring point/mm	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%
insulation size	measuring point/mm	d=149 mm		d=199 mm		d=249 mm		d=299 mm
l₁=2 mm l₂=18 mm	(0,0, 1)	78275	16.63	54525	8.51	42449	5.70	34973	4.57
	(0,0, 40)	80811	20.41	54913	9.28	42541	5.93	35071	4.86
	(0,0, 80)	88251	31.49	56975	13.38	42817	6.61	35121	5.01
	(0,0, 120)	—	—	62002	23.38	44270	10.23	35275	5.47
	(0,0, 160)	—	—	—	—	47509	18.30	36282	8.48
	(0,0, 200)	—	—	—	—	—	—	39134	17.01
	(0,0, d−51)	89744	33.72	64210	27.78	51174	27.42	43536	30.17
l₁=10 mm l₂=10 mm	(0,0, 1)	81041	20.75	55809	11.06	43097	7.31	35154	5.11
	(0,0, 40)	84301	25.61	56469	12.37	43213	7.60	35284	5.50
	(0,0, 80)	93231	38.91	59454	18.31	43772	8.99	35418	5.90
	(0,0, 120)	—	—	66239	31.82	45946	14.40	35702	6.75
	(0,0, 160)	—	—	—	—	51000	26.99	37055	10.79
	(0,0, 200)	—	—	—	—	—	—	40062	19.78
	(0,0,d−51)	95022	41.58	69146	37.60	55534	38.28	45989	37.51

Table 2. Electric field distribution and error after the probe is placed

measuring point/mm	amplitude/(V·m⁻¹)	error/(%)	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%	amplitude/(V·m⁻¹)	error/%
measuring point/mm	d=149 mm		d=199 mm		d=249 mm		d=299 mm
(0,0, 1)	68829	2.56	51688	2.85	41286	2.80	34512	3.19
(0,0, 40)	68313	1.79	51361	2.21	41127	2.41	34213	2.30
(0,0, 80)	67034	0.12	50797	1.09	40824	1.65	34019	1.72
(0,0, 120)	65880	1.84	50065	0.37	40345	0.46	33720	0.83
(0,0, 160)	—	—	49405	1.68	39871	0.72	33438	0.02
(0,0, 200)	—	—	—	—	39514	1.61	33120	0.97
(0,0, d−1)	65598	2.26	49214	2.06	39332	2.06	32738	2.11

Table 3. Electric field distribution and error of improved structure

Haoyan Wang, Junna Li, Yuhan Gong, Jian Liu. Electric field probe calibration and improvement method based on open TEM cell[J]. High Power Laser and Particle Beams, 2022, 34(9): 093002

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