• Laser & Optoelectronics Progress
  • Vol. 52, Issue 1, 11201 (2015)
Li Qi*, Yang Yongfa, Zhao Yongpeng, and Chen Deying
Author Affiliations
  • [in Chinese]
  • show less
    DOI: 10.3788/lop52.011201 Cite this Article Set citation alerts
    Li Qi, Yang Yongfa, Zhao Yongpeng, Chen Deying. Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials[J]. Laser & Optoelectronics Progress, 2015, 52(1): 11201 Copy Citation Text show less
    References

    [1] Zhang Xin, Zhao Yuanmeng, Deng Chao, et al.. Study on the passive terahertz image target detection[J]. Acta Optica Sinica, 2013, 33(2): 0211002.

    [2] Li Qi, Xue Kai, Li Huiyu, et al.. Advances in research of terahertz radar cross section measurements[J]. Laser & Optoelectronics Progress, 2012, 49(6): 060001.

    [3] Li Xinlei, Li Biao. Review on progress of real- time THz sensing and imaging technology[J]. Laser & Optoelectronics Progress, 2012, 49(9): 090008.

    [4] Zhao Yaqin, Zhang Liangliang, Zhu Dechong, et al.. Single- pixel terahertz imaging based on compressed sensing [J]. Chinese J Lasers, 2011, 38(s1): s111003.

    [5] S C Howells, L A Schlie. Transient terahetz reflection spectroscopy of undoped InSb from 0.1 to 1.1 THz[J]. Appl Phys Lett, 1996, 69(4): 550-552.

    [6] L Fekete, J Y Hlinka, F Kadlec, et al.. Active optical control of the terahertz reflectivity of high- resistivity semiconductors[J]. Opt Lett, 2005, 30(15): 1992-1994.

    [7] Yamac Dikmelik, James B Spicer. Effects of surface roughness on reflection spectra obtained by terahertz timedomain spectroscopy[J]. Opt Lett, 2006, 31(24): 3653-3655.

    [8] L M Zurk, G Sundberg, S Schecklman, et al.. Scattering effects in terahertz reflection spectroscopy[C]. SPIE, 2008, 6949: 694907.

    [9] Megan R Leahy- Hoppa, Michael J Fitch, Robert Osiander. Terahertz reflection spectroscopy for the detection of explosives[C]. SPIE, 2008, 6893: 689305.

    [10] Li Qi, Yang Yongfa, She Jianyu, et al.. Measurement of 2.52 THz relative back scattering characteristics in several kind of background materials [J]. Acta Optica Sinica, 2014, 34(s1): s112002.

    CLP Journals

    [1] Liu Jie, Jiang Jun, Cheng Binbin, Lu Bin, Jing Wen, Zhang Jian. D-Band Transmittance of Typical Clothing[J]. Acta Optica Sinica, 2016, 36(7): 711001

    [2] Fan Changkun, Li Qi, Zhou Yi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness[J]. Laser & Optoelectronics Progress, 2016, 53(11): 111201

    Li Qi, Yang Yongfa, Zhao Yongpeng, Chen Deying. Measurement Investigation of Continuous Wave Terahertz Back Scattering Characteristics in Three Kinds of Background Materials[J]. Laser & Optoelectronics Progress, 2015, 52(1): 11201
    Download Citation