An Automatic Test System for Optical Passive Device Performance

Caofan Jin; Xiang Zhang; Tao Chen; Yue Guo; Yanjing Wang

doi:10.3788/LOP57.132302

Journals >Laser & Optoelectronics Progress >Volume 57 >Issue 13 >Page 132302 > Article

Laser & Optoelectronics Progress
Vol. 57, Issue 13, 132302 (2020)

An Automatic Test System for Optical Passive Device Performance

Caofan Jin^*, Xiang Zhang, Tao Chen, Yue Guo, and Yanjing Wang

Author Affiliations

Shanghai Optical Transmission and Sensing Engineering Technology Research Center No.23 Research Institute, China Electronics Technology Group Corporation, Shanghai 201900, China

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DOI: 10.3788/LOP57.132302 Cite this Article Set citation alerts

Caofan Jin, Xiang Zhang, Tao Chen, Yue Guo, Yanjing Wang. An Automatic Test System for Optical Passive Device Performance[J]. Laser & Optoelectronics Progress, 2020, 57(13): 132302 Copy Citation Text

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Fig. 1. Schematic of DOP measurement

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Fig. 2. DS-DBR laser structure

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Fig. 3. System block diagram

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Fig. 4. Schematic of system program running process

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Parameter	Symbol	Unit	Value
Spectral range	λ	nm	800-1700
Dark current	I_d(V_R=5 V)	pA	5
Reverse breakdown voltage	V_BR(I_R=10 μA)	V	40
Response time	T_r(R_L=50 Ω,V_R=5 V)	ps	120
Band width(-3 dB)	B_w(R_L=50 Ω,V_R=5 V)	GHz	3

Table 1. Electrical and optical characteristics of photoelectric detector

Wavelength /nm	PM400K4 /dBm	WDL1 /dB	System /dBm	WDL2 /dB	Absolute error /dB
1530	-3.37	/	-3.35	/	0.02
1535	-3.39	/	-3.38	/	0.01
1540	-3.44	/	-3.44	/	0
1545	-3.47	/	-3.49	/	0.02
1550	-3.52	/	-3.55	/	0.03
1555	-3.55	/	-3.60	/	0.05
1560	-3.58	/	-3.62	/	0.04
1565	-3.62	/	-3.65	/	0.03
/	/	0.25	/	0.30	0.05

Table 2. WDL test data

DOP /%	PM400K4 /dBm	PDL1 /dB	System /dBm	PDL2 /dB	Absolute error /dB
0	-3.87	/	-3.90	/	0.03
10	-3.89	/	-3.93	/	0.04
20	-3.94	/	-3.97	/	0.03
30	-4.00	/	-4.02	/	0.02
40	-4.05	/	-4.08	/	0.03
50	-4.09	/	-4.11	/	0.02
60	-4.12	/	-4.16	/	0.04
70	-4.15	/	-4.20	/	0.05
80	-4.19	/	-4.23	/	0.04
90	-4.22	/	-4.27	/	0.05
100	-4.27	/	-4.32	/	0.05
/	/	0.40	/	0.42	0.02

Table 3. PDL test data

Caofan Jin, Xiang Zhang, Tao Chen, Yue Guo, Yanjing Wang. An Automatic Test System for Optical Passive Device Performance[J]. Laser & Optoelectronics Progress, 2020, 57(13): 132302

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