• Chinese Optics Letters
  • Vol. 8, Issue s1, 105 (2010)
Dandan Liu1, Huasong Liu1、2, Yiqin Ji1、3, Fuhao Jiang4, and Deying Chen3
Author Affiliations
  • 1Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China
  • 2Institute of Precision Optical Engineering, Tongji University, Shanghai 200192, China
  • 3National Key laboratory of Tunable Laser, Institute of Optical-Electronics, Harbin Institute of Technology, Harbin 150001, China
  • 4Beijing Institute of Automation Control Equipment, Beijing 100074, China
  • show less
    DOI: 10.3788/COL201008s1.0105 Cite this Article Set citation alerts
    Dandan Liu, Huasong Liu, Yiqin Ji, Fuhao Jiang, Deying Chen. Analysis of the magnitude and distribution of low loss thin film[J]. Chinese Optics Letters, 2010, 8(s1): 105 Copy Citation Text show less
    References

    [1] G. Rempe, R. J. Thompson, H. J. Kimble, and R. Lalezari, Opt. Lett. 17, 363 (1992).

    [2] N. A. Robertson, K. A. Strain, and J. Hough, Opt. Commun. 69, 345 (1989).

    [3] Y. Ji, Y. Cui, H. Liu, J. Zong, H. Song, W. Hong, F. Jiang, and C. Sun, Infrared Laser Engineering (in Chinese) 37, 505 (2008).

    [4] H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1961).

    [5] J. Wang, R. L. Maier, and J. H. Bruning, Proc. SPIE 5188, 106 (2003).

    Dandan Liu, Huasong Liu, Yiqin Ji, Fuhao Jiang, Deying Chen. Analysis of the magnitude and distribution of low loss thin film[J]. Chinese Optics Letters, 2010, 8(s1): 105
    Download Citation