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Journals >Opto-Electronic Engineering >Volume 32 >Issue 5 >Page 42 > Article

Opto-Electronic Engineering
Vol. 32, Issue 5, 42 (2005)

[in Chinese]

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(5): 42 Copy Citation Text

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References

[3] NAGARKAR V V, GORDON J S, GUPTA T K, et al. CCD-based high resolution digital radiography system for nondestructive evaluation[J]. IEEE Trans.Nucl.Sci, 1997, 44(3): 885-889.

CLP Journals

[1] LI Wei, ZHAO Bao-sheng, ZHAO Fei-fei, CAO Xi-bin. Analysis and Correction for Nonuniformity of the Two Side Proximity of X-ray Image Intensifier Radiography[J]. Acta Photonica Sinica, 2009, 38(6): 1353

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(5): 42

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