• Opto-Electronic Engineering
  • Vol. 42, Issue 1, 25 (2015)
PAN Weiqing1、2、*, GONG Guofang2, and FAN Yufeng3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • show less
    DOI: 10.3969/j.issn.1003-501x.2015.01.005 Cite this Article
    PAN Weiqing, GONG Guofang, FAN Yufeng. Low Noisy Dual Wavelength Digital Holography and Application in the Ultra-precision Machining Surface Measurement[J]. Opto-Electronic Engineering, 2015, 42(1): 25 Copy Citation Text show less
    References

    [1] Yamaguchi Hitomi,Shinmura Takeo,Takenaga Maki. Development of a new precision internal machining process using an alternating magnetic field [J]. Precision Engineering(S0141-6359),2003,27(1):51-58.

    [2] YUAN Julong,WANG Zhiwei,WEN Donghui,et al. Review of the current situation of ultra-precision machining [J]. Chinese Journal of Mechanical Engineering,2007,43(1):35-48.

    [3] Lonardo P M,Lucca D A,De Chiffre L. Emerging trends in surface metrology [J]. CIRP Annals-Manufacturing Technology(S0007-8506),2002,51(2):701-723.

    [4] WANG Yunqing,LI Qingxiang,ZHOU Zaoying,et al. Dynamic analysis and nonlinear error elimination of the stylus-based profile measuring mechanism [J]. Chinese Journal of Scientific Instrument,1996,17(6):606-611.

    [5] http://www.taylor-hobson.com.

    [6] Binnig G,Rohrer H,Gerber Ch,et al. Surface studies by scanning tunneling microscopy [J]. Phys. Rev. Lett(S0031-9007), 1982,49(1):57–60.

    [7] Rabe U,Arnold W. Atomic-force microscopy at MHz frequencies [J]. Annalen der Physik (S1521-3889),1994,3(7/8): 589-598.

    [8] Cuche E,Bevilacqua F,Depeursinge C. Digital holography for quantitative phase-contrast imaging [J]. Opt. Lett(S0146-9592), 1999,24(5):291-293.

    [9] Marquet P,Rappaz B,Magistretti J,et al. Digital holographicmicroscopy:a noninvasive contrast imaging technique allowing quantitative visualization of living cells with subwavelength axial accuracy [J]. Opt. Lett(S0146-9592),2005,30(5):468-470.

    [10] ZHONG Liyun,ZHANG Yimo,Lü Xiaoxu,et al. Analysis of Some Fundamental Issue about Digital Hologram [J]. Acta Optica Sinica,2004,24(4):465-471.

    [11] Yamaguchi I,Ida T,Yokota M,et al. Surface shape measurement by phase-shifting digital holography with a wavelength shift [J]. Applied Optics(S1539-4522),2006,45(29):7610-7616.

    [12] ZENG Yanan,WANG Fei,LEI Hai,et al. Surface Profile Measurement of Microstructures Based on Dual-Wavelength Digital Microscopic Image-Plane Holography [J]. Acta Optica Sinica,2013,33(10):1009001.

    [13] Itoh K. Analysis of the phase unwrapping algorithm [J]. Applied Optics(S1539-4522),1982,21(14):2470.

    [14] ZHANG Yizhuo,WANG Dayong,ZHAO Jie,et al. Investigation on Phase Unwrapping Algorithms in Digital Holography [J]. Acta Optica Sinica,2009,29(12):3323-3327.

    [15] Kuhn J,Colomb T,Montfort F,et al. Real-time dual-wavelength digital holographic microscopy with a single hologram acquisition [J]. Opt. Express(S094-4087),2007,15(12):7231-7242.

    [16] WANG Yujia,JIANG Zhuqing,GAO Zhirui,et al. Investigation on Phase Unwrapping in Dual-Wavelength Digital Holography [J]. Acta Optica Sinica,2012,32(10):1009001-6.

    PAN Weiqing, GONG Guofang, FAN Yufeng. Low Noisy Dual Wavelength Digital Holography and Application in the Ultra-precision Machining Surface Measurement[J]. Opto-Electronic Engineering, 2015, 42(1): 25
    Download Citation