• Opto-Electronic Engineering
  • Vol. 37, Issue 11, 37 (2010)
XU Yin1, SUN Xiao-quan1, SHAO Li1、2, and WANG Ya-fu1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    XU Yin, SUN Xiao-quan, SHAO Li, WANG Ya-fu. Evaluation Method for Laser Jamming Effect Based on Probability of Edge Metric[J]. Opto-Electronic Engineering, 2010, 37(11): 37 Copy Citation Text show less
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    XU Yin, SUN Xiao-quan, SHAO Li, WANG Ya-fu. Evaluation Method for Laser Jamming Effect Based on Probability of Edge Metric[J]. Opto-Electronic Engineering, 2010, 37(11): 37
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