• Journal of Infrared and Millimeter Waves
  • Vol. 40, Issue 2, 150 (2021)
Lei XU1, Er-Tao HU2, Hua-Tian TU1, Wen-Shuai REN1, Rong HE1, Song-You WANG1, Hai-Bin ZHAO1, Rong-Jun ZHANG1, Yu-Xiang ZHENG1, and Liang-Yao CHEN1、*
Author Affiliations
  • 1Department of Optical Science and Engineering,Fudan University,Shanghai 200433,China
  • 2College of Electronic and Optical Engineering & College of Microelectronics,Nanjing University of Posts and Telecommunications,Nanjing 210023,China
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    DOI: 10.11972/j.issn.1001-9014.2021.02.002 Cite this Article
    Lei XU, Er-Tao HU, Hua-Tian TU, Wen-Shuai REN, Rong HE, Song-You WANG, Hai-Bin ZHAO, Rong-Jun ZHANG, Yu-Xiang ZHENG, Liang-Yao CHEN. Optimization and preparation of the high-efficiency solar selective absorber based on double W-SiO2 cermet layers[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 150 Copy Citation Text show less
    Schematic of the solar absorber consisting of double W-SiO2-cermet layers
    Fig. 1. Schematic of the solar absorber consisting of double W-SiO2-cermet layers
    Measured reflectance spectra of the thick W, Ni, Pt, Cu, and Cr films deposited onto the Si substrate.
    Fig. 2. Measured reflectance spectra of the thick W, Ni, Pt, Cu, and Cr films deposited onto the Si substrate.
    Experimental (symbol) and fitted (line) ellipsometry data Ψ (a) and Δ (b) of the composite films with varying deposition power of W as measured at the incident angle of 65°
    Fig. 3. Experimental (symbol) and fitted (line) ellipsometry data Ψ (a) and Δ (b) of the composite films with varying deposition power of W as measured at the incident angle of 65°
    Refractive index n (a) and extinction coefficient k (b) of the W-SiO2 nanocomposite thin films with different deposition power of W
    Fig. 4. Refractive index n (a) and extinction coefficient k (b) of the W-SiO2 nanocomposite thin films with different deposition power of W
    Measured and calculated reflectance spectra of the solar selective absorber containing double W-SiO2 cermet layers with optimal structure parameters
    Fig. 5. Measured and calculated reflectance spectra of the solar selective absorber containing double W-SiO2 cermet layers with optimal structure parameters
    Measured spectra of the absorbance, reflectance and transmittance under the near normal-incidence condition in the wavelength region of 250∼1 500 nm
    Fig. 6. Measured spectra of the absorbance, reflectance and transmittance under the near normal-incidence condition in the wavelength region of 250∼1 500 nm
    Layers

    DC power

    /W

    RF power

    /W

    Thickness

    /nm

    Metal volume fraction
    W50-1501
    W-SiO2(HMVF)60200940.67
    W-SiO2(LMVF)10200340.27
    SiO2-150470
    Table 1. Growth parameters of the W-SiO2 double cermet solar selective absorber
    T/K300400500600
    ε(0,T)0.0500.0730.0990.124
    Table 2. Thermal emittance ε0,T of the solar selective absorber based on the double-W-SiO2-layered structure
    Lei XU, Er-Tao HU, Hua-Tian TU, Wen-Shuai REN, Rong HE, Song-You WANG, Hai-Bin ZHAO, Rong-Jun ZHANG, Yu-Xiang ZHENG, Liang-Yao CHEN. Optimization and preparation of the high-efficiency solar selective absorber based on double W-SiO2 cermet layers[J]. Journal of Infrared and Millimeter Waves, 2021, 40(2): 150
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