• Chinese Optics Letters
  • Vol. 12, Issue 6, 060017 (2014)
P. W. and T.-C. Poon
DOI: 10.3788/col201412.060017 Cite this Article Set citation alerts
P. W., T.-C. Poon. Data-embedded-error-diffusion hologram (Invited Paper)[J]. Chinese Optics Letters, 2014, 12(6): 060017 Copy Citation Text show less

Abstract

This paper describes a method for converting a complex Fresnel hologram into a phase-only hologram that can be embedded with large amount of data. Briefly, each row of pixels in the hologram is scanned sequentially in a left-to-right direction. The magnitude of each visited pixel is set to a constant, and its phase is embedded with the data. Subsequently, the error is diffused to the neighborhood pixels. The phase hologram realized with such means, which is referred to as the data-embedded-error-diffusion (DEED) hologram, is capable of preserving high fidelity on the content of the hologram and the embedded data.
P. W., T.-C. Poon. Data-embedded-error-diffusion hologram (Invited Paper)[J]. Chinese Optics Letters, 2014, 12(6): 060017
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