• Infrared and Laser Engineering
  • Vol. 47, Issue 7, 720003 (2018)
Hou Zhijin1、2、3、*, Fu Li1, Lu Zhengxiong2、3, Si Junjie2、3, Wang Wei2、3, and Lv Yanqiu2、3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/irla201847.0720003 Cite this Article
    Hou Zhijin, Fu Li, Lu Zhengxiong, Si Junjie, Wang Wei, Lv Yanqiu. Novel optical filter to identify the connected defective elements in focal plane array[J]. Infrared and Laser Engineering, 2018, 47(7): 720003 Copy Citation Text show less
    References

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    [4] Meng Qingduan, Zhang Xiaoling, Lv Yanqiu, et al. Local delamination of InSb IRFPAs in liquid nitrogen shock tests, [J]. Infrared Physics & Technology, 2017, 86: 207-211.

    [5] Sun C H, Zhang P, Zhang T N, et al. ZnS thin films grown by atomic layer deposition on GaAs and HgCdTe substrates at very low temperature[J]. Infrared Physics & Technology, 2017, 85: 280-286.

    [6] Qiu W, Hu W, Lin C, et al. Surface leakage current in 12.5 μm long-wavelength HgCdTe infrared photodiode arrays[J]. Optics Letters, 2016, 41: 828-831.

    [7] Bowden N, Brittain S, Evans A G, et al. Spontaneous formation of ordered structures in thin films of metals supported on an elastomeric polymer[J]. Nature, 1998, 393 (14): 146-149.

    [8] Zhang Xiaoling, Meng Qingduan, Zhang Liwen, et al. Negative electrode structure design in InSb focal plane arrays detector for deformation reduction[J]. Journal of Mechanical Science and Technology, 2014, 28(6): 2281-2285.

    [9] Wang Wei, Fan Yanyu, Si Junjie, et al. Analysis on formation of bad pixel cluster in IRFPA [J]. Infrared and Laser Engineering, 2012, 41(11): 2857-2860.

    [10] Wang Wei, Fan Yanyu, Si Junjie, et al. Types and determination of bad pixels in IRFPA[J]. Infrared and Laser Engineering, 2012, 41(9): 2261-2264.

    [11] Chris Littler. Characterization of impurities and defects in InSb and HgCdTe using novel magneto-optical techniques[C]//SPIE, 1993, 2021: 184-201.

    [12] Mike Davis, Mark Greiner. Indium antimonide large-format detector arrays[J]. Optical Engineering, 2011, 50(6): 061016.

    [13] Rawe R, Martin C, Garter M, et al. Novel high fill-factor, small pitch, reticulated InSb IR FPA design[C]//SPIE, 2005, 5783: 899-906.

    [14] Hou Zhijin, Fu Li, Wang Wei, et al. Study on connected defective elements in focal plane array identification by response and crosstalk[J]. Infrared and Laser Engineering, 2017, 46(4): 0420001. (in Chinese)

    Hou Zhijin, Fu Li, Lu Zhengxiong, Si Junjie, Wang Wei, Lv Yanqiu. Novel optical filter to identify the connected defective elements in focal plane array[J]. Infrared and Laser Engineering, 2018, 47(7): 720003
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