[1] Kenneth D Fourspring, Zoran Ninkov, John P Kerekes, et al. Proc. of SPIE, 2010, 7739: 77393X.
[2] Goldstein N, Vujkovic-Cvijin P, Fox M J, et al. US Patent, 2008, 7: 324.
[3] Waldis S, et al. Proc. of SPIE, 2008, 7018: 70182S.
[4] Chen Yuheng, Ji Yiqun, Zhou Jiankang, et al. Proc. of SPIE, 2010, 7658: 765834.
[5] Michael Canonica, Frederic Zamkotsian, Patrick Lanzoni, et al. Proc. of SPIE, 2011, 7930: 79300N.
[6] Spanò P, et al. Proc. of SPIE, 2009, 7436: 74360O.
[7] Fixsen D J, Greenhouse M A, MacKenty J W, et al. Proc. of SPIE, 2009, 7249: 72490X.
[8] Xu Jun, Hu Bingliang, Feng Dazheng, et al. Optics and Lasers in Engineering, 2012, 50(3): 458.
[9] Goldstein N, Vujkovic-Cvijin P, Fox M B, et al. Proc. of SPIE, 2009, 7210: 721008.
[10] Love S P. Proc. of SPIE, 2009, 7210: 721007.
[11] Xu Jun, Hu Bingliang, Feng Dazheng. Applied Spectroscopy, 2012, 66(9): 1044.