• Opto-Electronic Engineering
  • Vol. 32, Issue 1, 55 (2005)
[in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(1): 55 Copy Citation Text show less
    References

    [1] Mitsuo TAKEDA, Kazuhiro MUTOH. Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Appl. Opt,1983,22(24):3977-3982.

    [2] JUDGE T. R,BRYANSTON-CROSS P. J. Review of phase unwrapping techniques in fringe analysis [J]. Optics and Lasers in Engineering,1994,21(4):199-239.

    [3] SU Xian-yu,CHEN Wen-jing. Fourier transform profilometry:a review[J]. Optics and Lasers in Engineering,2001,35(5):263-284.

    [4] SU Xian-yu,CHEN Wen-jing. Reliability-guided phase unwrapping algorithm:a review[J]. Optics and Lasers in Engineering,2004,42(3):245-261.

    [5] CHEN Wen-jing,SU Xian-yu,CAO Yi-ping,et al. Improving Fourier transform profilometry based on bicolor fringe pattern[J]. Optical Engineering,2004,43(1):192-198.

    [8] CASTLEMAN K R. Digital Image Processing [M].Beijing:Prentice Hall Inc,1996.

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    [3] LI Jian-min, NIU Zhen-feng, WANG Yan-feng, SHAO Xue-hui, CHEN Fang, ZHANG Xiao-pan, LUO Jing, YANG Fu. Far-field Interference and Diameter Measurement on Two Coherent Plane Waves Irradiating Sphere[J]. Acta Photonica Sinica, 2015, 44(9): 912002

    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(1): 55
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