[1] Xu Deyan, Wang Qing, Gao Zhishan. Active Optical Element Testing and International Standard［M］. Beijing: Science Press, 2009. 92～93

[2] Karl-Edmund Elssner, R. Burow, J. Grzanna. Absolute sphericity measurement［J］. Appl. Opt., 1989, 28(21): 4649～4661

[3] M. Vannoni, G. Molesini. Three-flat test with plates in horizontal posture［J］. Appl. Opt., 2008, 47(12): 2133～2145

[4] M. Vannoni, A. Sordini, G. Molesimi. Long-term deformation at room temperature observed in fused silica［J］. Opt. Express, 2010, 18(5): 5114～5123

[5] V. Greco, G. Molesini. Micro-temperature effects on absolute flatness test plates［J］. Pure Appl. Opt., 1998, 7(6): 1341～1346

[6] C. J. Evans, R. N. Kestner, C. J. Evans et al.. Test optics error removal［J］. Appl. Opt., 1996, 35(7): 1015～1021

[7] Daniel Malacara. Optical Shop Testing［M］. Third edition, New Jersey: Wiley-Interscience, 2007, 32: 40～46

[8] Liu Dong, Yang Yongying, Tian Chao et al.. Analysis and correction of retrace error for non-null aspheric testing［J］. Acta Optica Sinica, 2009, 29(3): 688～697

[9] Miao Erlong, Zhang Jian, Gu Yongqiang et al.. Measurement error analysis of high precision fizeau interferometer for lithography projection objective［J］. Chinese J. Lasers 2010, 37(8): 2029～2034

[10] Gao Zhishan. Analysis of coincidence tolerance between F′ and C for the transmission spheres with small F-number［J］. Chinese J. Lasers, 2004, 31(7): 793～796

[11] Xie Yi, Chen Qiang, Wu Fan et al.. Concave aspherical surface testing with twin computer generated holograms［J］. Acta Optica Sinica, 2008, 28(7): 1313～1317

[12] R. Schreiner, J. Schwider, N. Linidlein et al.. Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions［J］. Appl. Opt., 2008, 47(32): 6134～6141

[13] J. C. Wyant. Absolute testing of flats by using even and odd functions［J］. Appl. Opt., 1993, 32(25): 4698～4705

[14] M. Vannoni, G. Molesini. Absolute planarity with three-flat test: an iterative approach with Zernike polynomials［J］. Opt. Express, 2008, 16(1): 340～354

[15] R. E. Parks, L. Shao, C. J. Evans. Pixel-based absolute topography test for three flats［J］. Appl. Opt., 1998, 37(25): 5951～5956

[16] U. Griesmann. Three-flat test solutions based on simple mirror symmetry［J］. Appl. Opt., 2006, 45(23): 5856～5865

[17] Xu Chen, Chen Lei. Absolute flatness measurement of optical surfaces［J］. Opt. Technol., 2006, 32(5): 775～778

[18] Daniel Malacara, Manuel Servín, Zacarias Malacara. Interferogram Analysis for Optical Testing［M］. CRC Press, 2005. 137～144

[19] Yan Jingzhou, Lei Fan. Algorithms for wavefront fitting using Zernike polynomial［J］. Optics and Precision Engineering, 1999, 7(5): 119～128

[20] J. Y. Wang, D. E. Silva. Wave-front interpretation with Zernike polynomials［J］. Appl. Opt., 1980, 19(19): 1510～1518

[21] Shan Baozhong, Wang Shuyan, Niu Hanben et al.. Zernike polynomial fitting method and its application［J］. Optics and Precision Engineering, 2002, 10(3): 318～323

[22] Xie Bin, Xiao Zhihong, Yu Jinchi. Analyzing thermal deformation of ultra-thin mirror using Zernike polynomials［J］. Optics and Precision Engineering, 2007, 15(2): 173～179

[23] D. Malacara. Wavefront fitting with discrete orthogonal polynomials in a units radius circle［J］. Opt. Engng., 1990, 29(6): 672～675

[24] R. R. Shannon, J. C. Wyant. Catalog of Zernike polynomials［J］. Appl. Opt. & Opt. Engng., 1987, 10: 193～221

[25] J. C. Wyant. http://www.optics.arizona.edu/jcwyant/Zernikes/ZernikePolynomialsForTheWeb.pdf