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    Journals >Opto-Electronic Engineering >Volume 30 >Issue 2 >Page 32 > Article
    • Opto-Electronic Engineering
    • Vol. 30, Issue 2, 32 (2003)
    An automatic inspection system for random defects on strongly reflective and complex surface
    [in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]1, and [in Chinese]1
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  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An automatic inspection system for random defects on strongly reflective and complex surface[J]. Opto-Electronic Engineering, 2003, 30(2): 32 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An automatic inspection system for random defects on strongly reflective and complex surface[J]. Opto-Electronic Engineering, 2003, 30(2): 32
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