• Infrared and Laser Engineering
  • Vol. 51, Issue 5, 20220276 (2022)
[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: 10.3788/IRLA20220276 Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Infrared and Laser Engineering, 2022, 51(5): 20220276 Copy Citation Text show less
    Experimental schematic
    Fig. 1. Experimental schematic
    Experimental results. (a1) The intensity profile of the laser array; (a2) The time-domain distribution of the light intensity inside the pin-hole in the open-loop state; (a3) The zoomed long exposure image in the open-loop state; (b1) The intensity profile of interference fringes; (b2) The spectrogram of light intensity inside the pin-hole in the open-loop state; (b3) The zoomed long exposure image in the close-loop state
    Fig. 2. Experimental results. (a1) The intensity profile of the laser array; (a2) The time-domain distribution of the light intensity inside the pin-hole in the open-loop state; (a3) The zoomed long exposure image in the open-loop state; (b1) The intensity profile of interference fringes; (b2) The spectrogram of light intensity inside the pin-hole in the open-loop state; (b3) The zoomed long exposure image in the close-loop state
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Infrared and Laser Engineering, 2022, 51(5): 20220276
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