Zhen-Bing DAI, Guo-Yu LUO, Yan HE, Chong WANG, Hu-Gen YAN, Zhi-Qiang LI. Near-field imaging of WTe2[J]. Journal of Infrared and Millimeter Waves, 2022, 41(2): 464
- Journal of Infrared and Millimeter Waves
- Vol. 41, Issue 2, 464 (2022)
Fig. 1. Schematic of the set-up of s-SNOM
Fig. 2. Near-filed signal of WTe2 thin film of different sample thickness at different incident light frequency（a）70 nm，910cm-1；（b）56 nm，1 550 cm-1；（c）52 nm，910 cm-1；（d）26 nm，1 550 cm-1
Fig. 3. （a）-（d）correspond to the topography of WTe2（black curve）and its O3A profile（red curve）along red dash line in figure 2，respectively
Fig. 4. The IR reflectance and optical conductance of WTe2 fitting by Drude-Lorentz model（a）IR reflectance fitting of WTe2 at 295 K，（b）IR conductance fitting of WTe2 at same temperature
Fig. 5. The real and imaginary part of dielectric function fitting of WTe2
Fig. 6. Illumination of tip-sample scattering in finite-dipole model
Fig. 7. The ratio of sample/substrate near field signal with different sample thickness at different incident frequency. Note：The hollow data point is the result of signal enhancement at the edge of the sample
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20