• Journal of Infrared and Millimeter Waves
  • Vol. 22, Issue 1, 13 (2003)
[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SPECTROSCOPIC ELLIPSOMETRY STUDIES OF BaxSr(1-x)TiO3 MULTILAYER STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 13 Copy Citation Text show less
    References

    [1] Uhlmann D R, Dawley J T, Poisl W H, et al. Ferroelectric Films. J.Sol-Gel Sci. and Tech., 2000, 19: 54 - 64

    [2] Thomas R, Dube D C, Kamalasanan M N, et al. Optical and electrical properties of BaTiO3 thin films prepared by chemical solution deposition. Thin Solid Films, 1999, 346: 212 - 225

    [3] Yeh M H, Liu Y C, Lin I N, et al. Electrical characteristics of barium titanate films prepared by laser ablation. J.Appl.Phys., 1993, 74: 2143 - 2145

    [4] Cho C R, Shi E, Jang M S, et al. Structural and electrical properties of BaTiO3 thin films on Si(100) substrate by hydrothermal synthesis. J.J.Appl.Phys., 1994, 33(9A): 4984 - 4990

    [5] Kittel C. Introduction to Solid State Physics. 6th edition. New York: Wiley, 1986, 292 - 294

    [6] Azzam R M A, Bashara N M. Ellipsometry and Polarized Light. North-Holland: Amsterdam, 1977, 186 - 190

    [8] Jasperson S N, Schnatterly S E. An improved method for high reflectivity ellipsometry based on a new polarization Modulation technique. Rev.Sci.Instrum., 1969, 40: 761 - 767

    [9] Colard S, Mihailovic M. Optimisation of experimental conditions for variable angle spectroscopic ellipsometry analysis. Application to GaAs/(Al,Ga)As quantum well characterization. Mat. Sci.Eng. B-Solid, 1999, B66: 88 - 91

    [10] Blaine D J, William A M, John A W. Optical analysis of complex multiplayer structures using multiple data types. Thin Solid Films, 1994, 253: 25 - 27

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. SPECTROSCOPIC ELLIPSOMETRY STUDIES OF BaxSr(1-x)TiO3 MULTILAYER STRUCTURE[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 13
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