• Opto-Electronic Engineering
  • Vol. 42, Issue 10, 78 (2015)
LUO Tongding*, YANG Shaohua, WANG Zujun, LI Gang, GUO Ming’an, and YAN Ming
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2015.10.014 Cite this Article
    LUO Tongding, YANG Shaohua, WANG Zujun, LI Gang, GUO Ming’an, YAN Ming. An Off-line Array CCD Test System for Ionizing Radiation Experiment[J]. Opto-Electronic Engineering, 2015, 42(10): 78 Copy Citation Text show less
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    [2] Jorden P,Ball K,Bell R,et al. Commercialization of full depletion scientific CCDs [C]// Astronomical Telescopes and Instrumentation International Society for Optics and Photonics,Florida ,USA,June 15,2006,12:627604-627604.

    [3] WANG Zujun,TANG Benqi,XIAO Zhigang,et al.Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation [J]. Acta Physics Sinica,2010,59(6):4136-4142.

    [4] XIAO Zhigang,TANG Benqi,LI Junli,et al. Experimental Study on Neutron-Induced Charge Transfer Degradation of Linear Charge Coupled Device [J]. Atomic Energy Science and Technology,2007,41(1):117-120.

    [5] LI Yudong,GUO Qi,LU Wu,et al. Research on Electron Irradiation Damage Effects of Charge Coupled Device [J].Atomic Energy Science and Technology,2012,46(3):346-350.

    [6] TANG Benqi,LIU Minbo,WANG Zujun,et al. Proton Radiation Effects of Charge-Coupled Device [J].Atomic Energy Science and Technology,2010,44(1):110-113.

    [7] WANG Zujun,ZHANG Yong,TANG Bengqi,et al. Analysis of Experiments on Total Dose Radiation Effects on TCD132D Linear CCD [J]. Chinese Journal of Electron Devices,2010,33(1):18-21.

    [8] WANG Zujun,LUO Tongding,YANG Shaohua,et al.Experiment of Ionizing Radiation Induced Array Charge Coupled Devices Dark Signal Increase [J]. Chinese Space Science and Technology,2014,34(4):72-78.

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    LUO Tongding, YANG Shaohua, WANG Zujun, LI Gang, GUO Ming’an, YAN Ming. An Off-line Array CCD Test System for Ionizing Radiation Experiment[J]. Opto-Electronic Engineering, 2015, 42(10): 78
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