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    Journals >Acta Optica Sinica >Volume 9 >Issue 1 >Page 75 > Article
    • Acta Optica Sinica
    • Vol. 9, Issue 1, 75 (1989)
    A Method for multiple angle of incidence ellipsometic analysis in determination of double-layer optical thin film parameters
    ZHANG RUIZI, LUO JINSHEN, and CHEN MIQI
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    ZHANG RUIZI, LUO JINSHEN, CHEN MIQI. A Method for multiple angle of incidence ellipsometic analysis in determination of double-layer optical thin film parameters[J]. Acta Optica Sinica, 1989, 9(1): 75 Copy Citation Text show less
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    ZHANG RUIZI, LUO JINSHEN, CHEN MIQI. A Method for multiple angle of incidence ellipsometic analysis in determination of double-layer optical thin film parameters[J]. Acta Optica Sinica, 1989, 9(1): 75
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