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    Journals >Laser & Optoelectronics Progress >Volume 54 >Issue 10 >Page 100201 > Article
    • Laser & Optoelectronics Progress
    • Vol. 54, Issue 10, 100201 (2017)
    Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra
    Hu Xiaotao*, Hao Xiaojian, and Duan Xianggang
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    DOI: 10.3788/lop54.100201 Cite this Article Set citation alerts
    Hu Xiaotao, Hao Xiaojian, Duan Xianggang. Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100201 Copy Citation Text show less
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    Article index updated: May. 18, 2024
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    Hu Xiaotao, Hao Xiaojian, Duan Xianggang. Temperature Measurement Technology Based on Double Line of Atomic Emission Spectra[J]. Laser & Optoelectronics Progress, 2017, 54(10): 100201
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