In order to measure the dynamic near infrared laser wavefront, a structure of oblique incidence of reflective shearing point diffraction interferometer is proposed. The point diffraction interferometer is integrated in flat substrate plated with special films. The coherent beams are reflected at the front and rear surfaces of the substrate respectively. The shear of the two beams introduces linear spatial carrier frequency to the point diffraction interferogram. The single shot interferogram is processed by Fourier transform method to retrieve the near infrared wavefront under test automatically. Experiment is carried on to test the transmitted wavefront of a F/10 lenses 1 313 nm wavelength and the result is in agreement with that obtained by Hartmann wavefront sensor. Image alignment method is studied that is used for quick pinhole alignment. As a result, the project can be applied to measure the dynamic near infrared wavefront.