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    Journals >Infrared and Laser Engineering >Volume 35 >Issue 4 >Page 449 > Article
    • Infrared and Laser Engineering
    • Vol. 35, Issue 4, 449 (2006)
    Measuring the thickness of phase objects by laser speckle method
    [in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
    Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measuring the thickness of phase objects by laser speckle method[J]. Infrared and Laser Engineering, 2006, 35(4): 449 Copy Citation Text show less
    References

    [1] ERF R K.Speckle Metrology[M].New York:Academic Press1978:92-115.

    [3] FRANCON M.Laser Speckle and Application in Optics[M].New York:Academi Press,1979:52-68.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measuring the thickness of phase objects by laser speckle method[J]. Infrared and Laser Engineering, 2006, 35(4): 449
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