Long distance microvibration measurement using external-cavity semiconductor laser

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Infrared and Laser Engineering >Volume 33 >Issue 3 >Page 253 > Article

Infrared and Laser Engineering
Vol. 33, Issue 3, 253 (2004)

Long distance microvibration measurement using external-cavity semiconductor laser

[in Chinese]^1、2、*, [in Chinese]¹, [in Chinese]², and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Long distance microvibration measurement using external-cavity semiconductor laser[J]. Infrared and Laser Engineering, 2004, 33(3): 253 Copy Citation Text

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References

[1] Sasaki O, Okazaki H. Sinusoidal phase modulating interferometry for surface profile measurement[J]. Appl Opt, 1986, 25(18): 3137-3140.

[2] Wang X Z, Sasaki O, Takebayashi Y. Sinusoidal phase-modulating Fizeau interferometer using a self-pumped phase conjugator for surface profile measurements[J]. Opt Eng, 1994, 33(8):2670-2674.

[4] Notomi M, Mitomi O, Yoshikuni Y. Broad-band tunable two-section laser diode with external grating feedback[J]. IEEE Photonics Technology Letters, 1990, 2(2): 85-87.

[5] Harvey K C, Myatt C J. External-cavity diode laser using a grazing-incidence diffraction grating[J]. Optics Letters, 1991, 16(12): 910-912.

[6] Takamasa Suzuki, Osami Sasaki, Shuich Takayama, et al. Real-time displacement measurement using synchronous detection in asinusoidal phase modulating interferometer[J]. Opt Eng, 1993, 32(4):1033-1037.

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Long distance microvibration measurement using external-cavity semiconductor laser[J]. Infrared and Laser Engineering, 2004, 33(3): 253

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