Temperature and spectral emissivity measurement of the metallic thermal protection blanket based on multi-wavelength thermometry

[in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 34 >Issue 8 >Page 59 > Article

Opto-Electronic Engineering
Vol. 34, Issue 8, 59 (2007)

Temperature and spectral emissivity measurement of the metallic thermal protection blanket based on multi-wavelength thermometry

[in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese]. Temperature and spectral emissivity measurement of the metallic thermal protection blanket based on multi-wavelength thermometry[J]. Opto-Electronic Engineering, 2007, 34(8): 59 Copy Citation Text

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References

[1] Blosser M L,Chen R,Poteet C.Advanced Metallic Thermal Protection System Development[A].The 40th Areospace Sciences Meeting&Exhibit[C].Reno,Nevada,USA:[sn],2002:1-20.

[2] Khan M A.Noncontact Temperature Measurement Ⅱ Least Squares Based Techniques[J].Rev Sci Instrum,1991,62(2):403-409.

[3] SUN Xiao-gang.The Theoretical Analysis of Multi-wavelength Pyrometer:Check and Autosearch for Emissivity General Expression[J].Journal of Harbin Institute of Technology,1998,5(3):36-40.

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