• Opto-Electronic Engineering
  • Vol. 34, Issue 8, 59 (2007)
[in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Temperature and spectral emissivity measurement of the metallic thermal protection blanket based on multi-wavelength thermometry[J]. Opto-Electronic Engineering, 2007, 34(8): 59 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese]. Temperature and spectral emissivity measurement of the metallic thermal protection blanket based on multi-wavelength thermometry[J]. Opto-Electronic Engineering, 2007, 34(8): 59
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