• High Power Laser and Particle Beams
  • Vol. 35, Issue 9, 091002 (2023)
Shanshan Wang1, Feng Shi2、*, Shuo Qiao2, Bowen Xu1, Qun Hao1、3, Ci Song2, Guipeng Tie2, Ye Tian2, Dede Zhai2, and Xing Peng2
Author Affiliations
  • 1Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2College of Intelligence Science, National University of Defense Technology, Changsha 410073, China
  • 3School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • show less
    DOI: 10.11884/HPLPB202335.220405 Cite this Article
    Shanshan Wang, Feng Shi, Shuo Qiao, Bowen Xu, Qun Hao, Ci Song, Guipeng Tie, Ye Tian, Dede Zhai, Xing Peng. Error-sensitive factors analysis and verification for optical element in-situ measurement device based on phase measuring deflectometry[J]. High Power Laser and Particle Beams, 2023, 35(9): 091002 Copy Citation Text show less

    Abstract

    Based on optical element’s high precision in-situ measurement requirements, this paper carries out the sensitive factor simulation analysis, studies the influence of systematic structural errors and temperature errors on the measurement results, and designs and builds an in-situ measurement device to carry out measurement experiments of system temperature change, system repeatability and system stability. The results show that the simulation detection model can be used for plane/spherical/aspherical/free surface, the influence on the measurement results is mainly reflected in the low frequency error, the high frequency error is relatively small, the maximum PV value of the measurement surface shape error does not exceed 68nm (about λ/10), and the maximum RMS value does not exceed 15 nm (about λ/40).
    Shanshan Wang, Feng Shi, Shuo Qiao, Bowen Xu, Qun Hao, Ci Song, Guipeng Tie, Ye Tian, Dede Zhai, Xing Peng. Error-sensitive factors analysis and verification for optical element in-situ measurement device based on phase measuring deflectometry[J]. High Power Laser and Particle Beams, 2023, 35(9): 091002
    Download Citation