• Laser & Optoelectronics Progress
  • Vol. 56, Issue 15, 151202 (2019)
Xiaoyun Ma1、2、3、4、5、*, Dan Zhu1、2、3、4、5, Chen Jin1、2、4、5, and Xinxin Tong1、2、4、5
Author Affiliations
  • 1 Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang, Liaoning 110016, China
  • 2 Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang, Liaoning 110016, China
  • 3 University of Chinese Academy of Sciences, Beijing 100049, China
  • 4 Key Laboratory of Opto-Electronic Information Processing, CAS, Shenyang, Liaoning 110016, China
  • 5 The Key Lab of Image Understanding and Computer Vision, Shenyang, Liaoning 110016, China
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    DOI: 10.3788/LOP56.151202 Cite this Article Set citation alerts
    Xiaoyun Ma, Dan Zhu, Chen Jin, Xinxin Tong. Bullet Appearance Defect Detection Based on Improved Faster Region-Convolutional Neural Network[J]. Laser & Optoelectronics Progress, 2019, 56(15): 151202 Copy Citation Text show less

    Abstract

    To realize automatic detection of bullet appearance defects and to overcome the limitations associated with traditional machine vision methods, i.e., excessive time required to manually design a target feature and generalization ability is poor in defect detection, we use the K-means++ algorithm to improve the anchor frame generation method and propose a bullet appearance defect detection model based on the improved faster region-convolutional neural network (R-CNN). The proposed model uses a CNN that can automatically extract target features and has strong generalization ability. The detection model is combined with ZFNet, VGG_CNN_M_1024, and VGG16, respectively. Results demonstrate that the detection accuracy of the detection model combined with VGG16 is higher than the others. The results show that that of the improved model demonstrates 97.75% accuracy and the speed reaches 28 frame·s -1.
    Xiaoyun Ma, Dan Zhu, Chen Jin, Xinxin Tong. Bullet Appearance Defect Detection Based on Improved Faster Region-Convolutional Neural Network[J]. Laser & Optoelectronics Progress, 2019, 56(15): 151202
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