• Opto-Electronic Engineering
  • Vol. 34, Issue 11, 61 (2007)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
Author Affiliations
  • [in Chinese]
  • show less
    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Sub-wavefront slope measurement based on Talbot effect moiré fringe technology[J]. Opto-Electronic Engineering, 2007, 34(11): 61 Copy Citation Text show less
    References

    [1] Yoon G Y,Jitsuno T,Nakatsuka M,et al.Shack-Hartmann wave-front measurement with a large F-number plastic microlens array[J].Appl.Opt,1996,35:188-192.

    [3] Silva D E.Talbot interferometer for radial and lateral derivatives[J].Appl.Opt,1972,11(11):2613-2624.

    [5] Jonh T.Theory of Fresnel Image.I.Plane Periodic Objects in Monochromatic Light[J].Journal of the Optical Society of America,1965,55(4):373-381.

    [7] Siegel Ch,Loewenthal F,Balmer J E,et al.A wavefront sensor based on the fractional Talbot effect[J].Optics Communications,2001,194:265-275.

    CLP Journals

    [1] Yan Xinxin, Zhang Lei, Zhang Wenzi, Liu Qinxiao, Yu Feihong. Extended SelfImaging Conditions for TwoDimensional Periodic Object[J]. Acta Optica Sinica, 2010, 30(9): 2562

    [2] WANG Yu-zhi, AI Hua, HAN Xu-dong. Extraction of Moiré Fringe Signal for Photoelectric Encoder Based on Grating Self-imaging[J]. Opto-Electronic Engineering, 2009, 36(1): 78

    [3] CHEN Yan-fei, SU Xian-yu, DOU Yun-fu. Fast Modulation Measurement Profilometry Based on Double Color Projections[J]. Opto-Electronic Engineering, 2009, 36(4): 17

    [4] Li Yao, Bai Jian, Deng Yan, Xu Qiao, Yang Guoguang. Study on a Wavefront Detection System for LongFocus Lens by SubWavefront Scanning[J]. Acta Optica Sinica, 2010, 30(9): 2590

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Sub-wavefront slope measurement based on Talbot effect moiré fringe technology[J]. Opto-Electronic Engineering, 2007, 34(11): 61
    Download Citation