Sub-wavefront slope measurement based on Talbot effect moir&#233; fringe technology

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 34 >Issue 11 >Page 61 > Article

Opto-Electronic Engineering
Vol. 34, Issue 11, 61 (2007)

Sub-wavefront slope measurement based on Talbot effect moiré fringe technology

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Sub-wavefront slope measurement based on Talbot effect moiré fringe technology[J]. Opto-Electronic Engineering, 2007, 34(11): 61 Copy Citation Text

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Sub-wavefront slope measurement based on Talbot effect moiré fringe technology[J]. Opto-Electronic Engineering, 2007, 34(11): 61

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