• Laser & Optoelectronics Progress
  • Vol. 52, Issue 6, 61101 (2015)
Wang Lingli*, Zhao Youquan, Zhai Ruiwei, Li Xia, Jiang Nan, and Liu Xiao
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/lop52.061101 Cite this Article Set citation alerts
    Wang Lingli, Zhao Youquan, Zhai Ruiwei, Li Xia, Jiang Nan, Liu Xiao. Analysis of Spark Properties of Xenon Flash Lamp Based on the Imaging Technology of Optical Speckle[J]. Laser & Optoelectronics Progress, 2015, 52(6): 61101 Copy Citation Text show less

    Abstract

    According to the flaming properties of xenon flash lamp, which is of small spot size, high brightness, and flash pulse, a new method based on optical imaging to capture the pulse flash is proposed to analyze the luminescence properties of xenon flash lamp. Through a neutral filter group attenuating light pulse, a light pulse testing platform with a charge-coupled device (CCD) is established. The continuous pulsed imaging is triggered by the output signal of xenon flash lamp controller to analyse the luminous stability of xenon flash lamp. Curves of the light pulse are obtained by controlling the high-voltage pulse driver energy. The result indicates that the intensity of light pulse increases with the driver energy increasing, which is consistent with the theoretical analysis. The speckle method proposed can be better applied to the optical and electrical performance characteristics testing, quality testing and the choice of electrode material about xenon flash lamp.
    Wang Lingli, Zhao Youquan, Zhai Ruiwei, Li Xia, Jiang Nan, Liu Xiao. Analysis of Spark Properties of Xenon Flash Lamp Based on the Imaging Technology of Optical Speckle[J]. Laser & Optoelectronics Progress, 2015, 52(6): 61101
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