[2] Beil A, Daum R, Matz G. Proceedings of SPIE, 1998, 3493: 32.
[3] Polak M L, Hall J L, Herr K C. Applied Optics, 1995, 34: 5406.
[4] Chaffin C T, Marshall N C, Chaffin N C. Field Analytical Chemistry and Technology, 1999, 3: 111.
[2] Beil A, Daum R, Matz G. Proceedings of SPIE, 1998, 3493: 32.
[3] Polak M L, Hall J L, Herr K C. Applied Optics, 1995, 34: 5406.
[4] Chaffin C T, Marshall N C, Chaffin N C. Field Analytical Chemistry and Technology, 1999, 3: 111.
Set citation alerts for the article
Please enter your email address