• Opto-Electronic Engineering
  • Vol. 32, Issue 5, 24 (2005)
[in Chinese]1 and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(5): 24 Copy Citation Text show less
    References

    [1] TAKASAKI H. Moire topography[J]. Appl. Opt, 1970, 9(9): 1467-1472.

    [4] TAKEDA Mitsuo, MUTOH Kazuhiro. Fourier transform profilometry for the automatic measurement 3D object shapes[J]. Appl. Opt, 1983, 22(24): 3977-3982.

    [7] G CONG, B PARVIN. An Algebraic Solution to Surface Recovery from Cross-Sectional Contours[J]. Graphical Models and Image Processing, 1999, 61(4): 222-243.

    [8] S H LEE, D G AHN, D Y YANG. Surface reconstruction for mid-slice generation on variable lamination manufacturing[J]. Journal of Materials Processing Technology, 2002, 130-131: 384-389.

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