• Opto-Electronic Engineering
  • Vol. 39, Issue 8, 55 (2012)
WANG Peng*, SUN Ji-yin, GUO Wen-pu, and GAO Jing
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2012.08.008 Cite this Article
    WANG Peng, SUN Ji-yin, GUO Wen-pu, GAO Jing. Analysis of Imaging Degradations Effect on the Quality of Forward Looking Infrared Image[J]. Opto-Electronic Engineering, 2012, 39(8): 55 Copy Citation Text show less
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    WANG Peng, SUN Ji-yin, GUO Wen-pu, GAO Jing. Analysis of Imaging Degradations Effect on the Quality of Forward Looking Infrared Image[J]. Opto-Electronic Engineering, 2012, 39(8): 55
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