Yangguang Xing, Lin Li, Jilong Peng, Shanshan Wang, Yinuo Cheng. Optical Design of Solar Extreme Ultraviolet Normal-Incidence Broadband Imaging Spectrometer with Non-Rowland Circle Mounting[J]. Acta Optica Sinica, 2020, 40(23): 2312005
- Acta Optica Sinica
- Vol. 40, Issue 23, 2312005 (2020)
Fig. 1. Schematic of solar EUV normal-incidence imaging spectrometer. (a) Rowland circle mounting; (b) non-Rowland circle mounting
Fig. 2. Schematic of aberration-corrected TVLS grating
Fig. 3. Schematic of optical layout of solar EUV broadband imaging spectrometer. (a) Two-dimensional optical layout; (b) three-dimensional model diagram
Fig. 4. Curve of the ruling density distribution of TVLS grating
Fig. 5. Ray tracing results. (a)-(c) RMS spots radii change with wavelengths under different off-axis FOV; (d) RMS spots radii versus FOV in the different wavelengths
Fig. 6. MTFs of optical system under different wavelengths. (a) λ=40 nm; (b) λ=53 nm; (c) λ=60 nm; (d) λ=73 nm
Fig. 7. Spectral resolution of system change with wavelength. (a) 40-47 nm; (b) 53-60 nm; (c) 66-73 nm
Fig. 8. Ray tracing module for different line-pairs spectral images
Fig. 9. Spectrum of line pairs imaged on three CCDs. (a) CCD-1; (b) CCD-2; (c) CCD-3
Fig. 10. Diffraction enclosed circle energy used to evaluate system's spatial resolution. (a) λ=43.5 nm; (b) λ=56.5 nm; (c) λ=69.5 nm
Fig. 11. Reflectance curve of SiC/Al multilayer film obtained by simulation change with wavelength
Fig. 12. TVLS grating efficiency and CCD quantum efficiency change with wavelength. (a) Grating efficiency; (b) CCD quantum efficiency
Fig. 13. Instrument effective area change with wavelength. (a) Proposed instrument; (b) Solar Orbiter/SPICE
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Table 1. Technical indicators of solar EUV imaging spectrometers
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Table 2. Fjk and its corresponding aberrations
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Table 3. Examples of temperature and density for diagnostic plasma line in the observed spectral region
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Table 4. Technical indicators and optical element parameters for imaging spectrometer
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Table 5. Simulation parameters for ray tracing module in ZEMAX non-sequential mode
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Table 6. Periodic SiC/Al multilayer film parameters
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