• Infrared and Laser Engineering
  • Vol. 34, Issue 1, 70 (2005)
[in Chinese]*, [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Progress of super-resolution reconstructing image schemes and application in remote-sensing image[J]. Infrared and Laser Engineering, 2005, 34(1): 70 Copy Citation Text show less
    References

    [1] Tekalp A M,Ozkan M KSezan M I. High-resolution reconstruction from lower-resolution image sequences and space-varying image restoration[A].IEEE International Conference on Acoustics Speec hand Signal Processing[C]. San Francisco :IEEE Press, 1992. Ⅲ -169-172.

    [2] Kim S P, Su Wen-yu. Recursive high-resolution reconstruction of blurred multiframe images[J].IEEE Transactions on Image Processing, 1993,2(4):534-539.

    [3] Patti A J,Sezan M I,Tekalp A M.Superresolution video reconstruction with arbitrary sampling lattices and nonzeero aperture time [J].IEEE Transactions on Image Processing,1997,6(8):1064-1076.

    [4] Elad M,Feuer A.Super-resolution reconstruction of an image[A].The 19th IEEE Conference in Israel[C].1996.391-394.

    [5] Hardie R C,Barnard K J, Armstrong E E.Joint-MAP registration and high-resolution image estimation using a sequence of undersampled images[J].IEEE Transactions on Image Processing,1997,6(12): 1621-1633.

    [9] Su Binghua, Jin Weiqi, Niu Lihong, et al. MPMAP super-resolution image restoration algorithm based on multiframe andmultisensor[A]. SPIE's Photonics Asia [C]. 2002,4925.5-9.

    CLP Journals

    [1] [in Chinese], [in Chinese], [in Chinese]. Super-resolution algorithm based on post wavelet treatment[J]. Infrared and Laser Engineering, 2008, 37(1): 173

    [2] Zhao Lin, Jin Weiqi, Chen Yinan, Su Binghua. Blind Restoration for Defocus Blurred Image Based on Autocorrelation of Derivative Image[J]. Acta Optica Sinica, 2008, 28(9): 1703

    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Progress of super-resolution reconstructing image schemes and application in remote-sensing image[J]. Infrared and Laser Engineering, 2005, 34(1): 70
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