Research on the technology measurement of length by double wavelength laser interference using phase shift

[in Chinese]

Journals >Infrared and Laser Engineering >Volume 32 >Issue 4 >Page 359 > Article

Infrared and Laser Engineering
Vol. 32, Issue 4, 359 (2003)

Research on the technology measurement of length by double wavelength laser interference using phase shift

[in Chinese]^*

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[in Chinese]

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[in Chinese]. Research on the technology measurement of length by double wavelength laser interference using phase shift[J]. Infrared and Laser Engineering, 2003, 32(4): 359 Copy Citation Text

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References

[3] Andrew Lewis. Measurement of length, surface form and thermal expansion coefficient for length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry[J].Meas Sci Technol, 1994,5(6):694-703.

[in Chinese]. Research on the technology measurement of length by double wavelength laser interference using phase shift[J]. Infrared and Laser Engineering, 2003, 32(4): 359

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