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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 3 >Page 40 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 3, 40 (2005)
    [in Chinese]
    [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(3): 40 Copy Citation Text show less
    References

    [1] LI Y S,YOUNG T Y,MAGERL J A. Subpixel edge detection and estimation with a microprocessor-controlled line scan camera[J]. IEEE Transactions on Industrial Electronics,1988,35(1):105-112.

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    [in Chinese], [in Chinese], [in Chinese]. [J]. Opto-Electronic Engineering, 2005, 32(3): 40
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