• Acta Optica Sinica
  • Vol. 31, Issue 5, 531004 (2011)
Xiong Xicheng*, Xie Quan, and Yan Wanjun
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos201131.0531004 Cite this Article Set citation alerts
    Xiong Xicheng, Xie Quan, Yan Wanjun. Study on Relation Between Thickness of β-FeSi2 Thin Film and Solar Photon Wavelength[J]. Acta Optica Sinica, 2011, 31(5): 531004 Copy Citation Text show less

    Abstract

    Combined with the solar spectrum, the photon absorption coefficient of the β-FeSi2 thin film has been analyzed, and then the thickness of the absorption layer of β-FeSi2 thin film solar cell has been analyzed and theoretically calculated. The results show that, under the condition of the β-FeSi2 thin film with high quality, when the optical absorption efficiency of the solar energy radiation reaches 90%, the absorption layer thickness of the β-FeSi2 thin film solar cell is at least 200 nm and the best thickness range is from 200 to 250 nm. The calculation result has been verified by some relative experimental studies. At the same time, the formula for the relation between the absorption layer thickness of the β-FeSi2 thin film solar cell and the solar photon wavelength has been obtained.
    Xiong Xicheng, Xie Quan, Yan Wanjun. Study on Relation Between Thickness of β-FeSi2 Thin Film and Solar Photon Wavelength[J]. Acta Optica Sinica, 2011, 31(5): 531004
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