• Opto-Electronic Engineering
  • Vol. 40, Issue 11, 22 (2013)
YAO Hongbing*, ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan, and JIANG Guangping
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2013.11.004 Cite this Article
    YAO Hongbing, ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan, JIANG Guangping. On-line Defect Detection Method Based on Two Image Acquisition Structures[J]. Opto-Electronic Engineering, 2013, 40(11): 22 Copy Citation Text show less
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    YAO Hongbing, ZENG Xiangbo, MA Guidian, ZHENG Xueliang, LI Yaru, GAO Yuan, YU Wenlong, GU Jinan, JIANG Guangping. On-line Defect Detection Method Based on Two Image Acquisition Structures[J]. Opto-Electronic Engineering, 2013, 40(11): 22
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