• Chinese Journal of Quantum Electronics
  • Vol. 29, Issue 2, 252 (2012)
Jin-bin CHEN*, Yong-hua LU, Jun TAO, Ming-fang YI, Pei WANG, and Hai MING
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1007-5461. 2012.02.020 Cite this Article
    CHEN Jin-bin, LU Yong-hua, TAO Jun, YI Ming-fang, WANG Pei, MING Hai. Investigation on propagation loss of silver nanowire plasmonic waveguides[J]. Chinese Journal of Quantum Electronics, 2012, 29(2): 252 Copy Citation Text show less

    Abstract

    By the far field excitation and measurement, propagation loss of wire’s surface plasmon is experimentally investigated with structure of branched-routing silver nanowire. The experimental results show that the propagation loss depends on the exciting wavelength. The coefficient of propagation loss is measured as 0.115 μm-1 at 632.8 nm and 0.0923 μm-1 at 780 nm. The propagation loss is smaller at longer wavelength, that is, SPP can propagate further at long-wavelength laser exciting. The measurement contributes to optimizing plasmonic devices based on silver nanowire waveguides.
    CHEN Jin-bin, LU Yong-hua, TAO Jun, YI Ming-fang, WANG Pei, MING Hai. Investigation on propagation loss of silver nanowire plasmonic waveguides[J]. Chinese Journal of Quantum Electronics, 2012, 29(2): 252
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