• Laser & Optoelectronics Progress
  • Vol. 58, Issue 8, 0822001 (2021)
Yongshun Qu*, Guiying Yu, Baowu Zhang**, Meidan Zhao, and Ruijie Lin
Author Affiliations
  • College of Metrology and Measurement Engineering, China Jiliang University, Hangzhou, Zhejiang 310018, China
  • show less
    DOI: 10.3788/LOP202158.0822001 Cite this Article Set citation alerts
    Yongshun Qu, Guiying Yu, Baowu Zhang, Meidan Zhao, Ruijie Lin. Simulation Research on Illumination Scheme for Bottom Defect Detection of Metal Barrel[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0822001 Copy Citation Text show less
    Optical path diagram for endoscopic non-positive illumination
    Fig. 1. Optical path diagram for endoscopic non-positive illumination
    Geometric relationship of bidirectional scattering distribution function
    Fig. 2. Geometric relationship of bidirectional scattering distribution function
    Distribution map of target surface test areas
    Fig. 3. Distribution map of target surface test areas
    Structural model of bottom illumination system of metal barrel
    Fig. 4. Structural model of bottom illumination system of metal barrel
    Model of image acquisition system
    Fig. 5. Model of image acquisition system
    Illuminance distributions and illuminance curves of target plane illuminated at different positions. (a1) (a2) 800 mm; (b1) (b2) 750 mm; (c1) (c2) 700 mm; (d1) (d2) 650 mm; (e1) (e2) 600 mm; (f1) (f2) 550 mm
    Fig. 6. Illuminance distributions and illuminance curves of target plane illuminated at different positions. (a1) (a2) 800 mm; (b1) (b2) 750 mm; (c1) (c2) 700 mm; (d1) (d2) 650 mm; (e1) (e2) 600 mm; (f1) (f2) 550 mm
    Bottom images of barrel illuminated at different positions in verification experiment and illumination compensation map. (a) 800 mm; (b) 750 mm; (c) 700 mm; (d) 650 mm; (e) illumination compensation map
    Fig. 7. Bottom images of barrel illuminated at different positions in verification experiment and illumination compensation map. (a) 800 mm; (b) 750 mm; (c) 700 mm; (d) 650 mm; (e) illumination compensation map
    Defect recognition for each illumination scheme
    Fig. 8. Defect recognition for each illumination scheme
    Serial numberDistance/ mmMinimum illuminance /luxAverage illuminance 1 /luxAverage illuminance 2 /luxSubject area uniformity /%Overall uniformity /%
    1550105.08113.12140.1292.8974.99
    2600102.11110.13133.2292.7276.65
    365099.13107.55132.8492.1774.62
    470098.46106.51130.7892.4475.29
    575098.38107.12129.9791.8475.69
    680098.03106.13129.3292.3775.80
    Table 1. Illuminance uniformity of object surface illuminated at different positions
    Yongshun Qu, Guiying Yu, Baowu Zhang, Meidan Zhao, Ruijie Lin. Simulation Research on Illumination Scheme for Bottom Defect Detection of Metal Barrel[J]. Laser & Optoelectronics Progress, 2021, 58(8): 0822001
    Download Citation