Regarding the speckle pattern caused by a coherently illuminated optical rough surface in the recording plane as a stable random signal, we propose here a new approach——the Electronic Speckle Pattern Normalized Cross-correlation Method or called as Electronic Speckle Pattern Photography (ESPP)——for the displacement measurement. This method, based on the normalized cross-correlation function, is the modified Speckle Pattern Correlation method in the application of the digital image processing technique to the speckle pattern metrology. Our experimental results show that ESPP for the displacement measurement has the advantages of measuring large-range displacement in high accuracy without loss of insensitivity to the environment disturbance and the quasi-real time processing property respectively as that the speckle photography and that in the electronic pattern interferometry.