Xin Li, Yong Chen, Weixian Li, Yangyang Li, Lei Zheng, Sijin Wu. Projection aided digital shearography scanning detection technology[J]. Infrared and Laser Engineering, 2021, 50(8): 20210509
- Infrared and Laser Engineering
- Vol. 50, Issue 8, 20210509 (2021)
Fig. 1. Schematic diagram of defect detection
Fig. 2. Image feature. (a) Physical picture; (b) Speckle pattern interferometry; (c) Projection pattern
Fig. 3. Measuring system
Fig. 4. Physical system
Fig. 5. Projection pattern
Fig. 6. Samples and test results. (a) Sample; (b) Test result
Fig. 7. Out-of-plane displacement gradients
Fig. 8. Projection image. (a) Projection field of view 1; (b) Projection field of view 2; (c) Projection field of view 3; (d) Full-field projection image
Fig. 9. Physical picture. (a) Physical field of view 1; (b) Physical field of view 2; (c) Physical field of view 3; (d) Full-field physical image
Fig. 10. Speckle pattern interferogram. (a) Interferogram 1; (b) Interferogram 2; (c) Interferogram 3; (d) Full-field interferogram
Fig. 11. Split field and full-field images. (a) Sub-field projection image; (b) Sub-field physical image; (c) Sub-field interferogram; (e) Projection image stitching; (f) Physical image stitching; (g) Interferogram stitching
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Table 1. Defect information
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