MEASUREMENT OF RESPONSE PEAK WAVELENGTH OF QUANTUM WELL INFRARED DETECTORS BY RAMAN SCATTERING

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Journal of Infrared and Millimeter Waves >Volume 24 >Issue 2 >Page 97 > Article

Journal of Infrared and Millimeter Waves
Vol. 24, Issue 2, 97 (2005)

MEASUREMENT OF RESPONSE PEAK WAVELENGTH OF QUANTUM WELL INFRARED DETECTORS BY RAMAN SCATTERING

[in Chinese]¹, [in Chinese]², [in Chinese]², [in Chinese]³, [in Chinese]³, and [in Chinese]⁴

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¹[in Chinese]

²[in Chinese]

³[in Chinese]

⁴[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. MEASUREMENT OF RESPONSE PEAK WAVELENGTH OF QUANTUM WELL INFRARED DETECTORS BY RAMAN SCATTERING[J]. Journal of Infrared and Millimeter Waves, 2005, 24(2): 97 Copy Citation Text

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References

[1] Toshihiko Makino. Analytical formulas for the optical gain of quantum well [J]. IEEE Journal of quantum electronics, 1996,32(3):493-501.

[2] Levine B F. Tunable long-wavelength detectors using graded barrier quantum well grown by electron beam source molecular beam epitaxy [J]. Appl. Phys. Lett., 1990,57(4):383-385.

[3] Sadal Adachi. GaAs, AlAs and AlxGa1-xAs material parameters for use in research and device applications [J]. J. Appl. Phys., 1985, 58(3):1-29.

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