• Acta Optica Sinica
  • Vol. 39, Issue 4, 0412012 (2019)
Kuang Peng1, Yiping Cao2、*, and Yingchun Wu3
Author Affiliations
  • 1 Hubei Key Laboratory of Ferro & Piezoelectric Materials and Devices, Faculty of Physics & Electronic Sciences, Hubei University, Wuhan, Hubei 430062, China;
  • 2 Department of Opto-Electronics, Sichuan University, Chengdu, Sichuan 610064, China
  • 3 School of Electronic and Information Engineering, Taiyuan University of Science and Technology, Taiyuan, Shanxi 0 30024, China
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    DOI: 10.3788/AOS201939.0412012 Cite this Article Set citation alerts
    Kuang Peng, Yiping Cao, Yingchun Wu. Improved Dual-Frequency On-Line Phase Measuring Profilometry Based on Full-Cycle Equal Phase-Shift Algorithm[J]. Acta Optica Sinica, 2019, 39(4): 0412012 Copy Citation Text show less
    On-line 3D measurement system based on full-cycle equal phase-shift algorithm
    Fig. 1. On-line 3D measurement system based on full-cycle equal phase-shift algorithm
    Dual-frequency fringe pattern
    Fig. 2. Dual-frequency fringe pattern
    Extracted modulation patterns in simulation. (a) Measured object; (b) first deformed fringe pattern; (c) spectral distribution of first deformed fringe pattern; (d) modulation pattern corresponding to first deformed fringe pattern
    Fig. 3. Extracted modulation patterns in simulation. (a) Measured object; (b) first deformed fringe pattern; (c) spectral distribution of first deformed fringe pattern; (d) modulation pattern corresponding to first deformed fringe pattern
    Simulated reconstruction. (a) First deformed fringe pattern after pixel matching; (b) second deformed fringe pattern after pixel matching; (c) reconstructed object; (d) error distribution
    Fig. 4. Simulated reconstruction. (a) First deformed fringe pattern after pixel matching; (b) second deformed fringe pattern after pixel matching; (c) reconstructed object; (d) error distribution
    Simulated reconstruction obtained with different methods. (a) Spectrum of first deformed fringe pattern after pixel matching obtained with filtering method; (b) first low-frequency component fringe pattern obtained with filtering method; (c) reconstructed object obtained with filtering method; (d) error distribution obtained with filtering method; (e) reconstructed object obtained with the method in Ref.[14]; (f) error distribution obtained with the method in Ref.[14]
    Fig. 5. Simulated reconstruction obtained with different methods. (a) Spectrum of first deformed fringe pattern after pixel matching obtained with filtering method; (b) first low-frequency component fringe pattern obtained with filtering method; (c) reconstructed object obtained with filtering method; (d) error distribution obtained with filtering method; (e) reconstructed object obtained with the method in Ref.[14]; (f) error distribution obtained with the method in Ref.[14]
    Experimental setup
    Fig. 6. Experimental setup
    Reconstruction experiment. (a) Measured object; (b) first deformed fringe pattern; (c) modulation pattern corresponded to first deformed fringe pattern; (d) first deformed fringe pattern after pixel matching; (e) reconstructed object; (f) cross section at y=320 pixel
    Fig. 7. Reconstruction experiment. (a) Measured object; (b) first deformed fringe pattern; (c) modulation pattern corresponded to first deformed fringe pattern; (d) first deformed fringe pattern after pixel matching; (e) reconstructed object; (f) cross section at y=320 pixel
    MethodMaximum error /mmRoot-mean-square error /mm
    Proposed method0.19300.0308
    Filtering method1.71190.1008
    Method in Ref.[14]1.16710.2272
    Table 1. Reconstruction errors obtained with three methods
    MethodProposed methodFiltering methodMethod in Ref.[14]
    Average height of measurement /mm2.952.892.93
    Root-mean-square /mm0.0810.1510.221
    Table 2. Measurement errors of planes with height of 3 mm obtained with three methods
    Kuang Peng, Yiping Cao, Yingchun Wu. Improved Dual-Frequency On-Line Phase Measuring Profilometry Based on Full-Cycle Equal Phase-Shift Algorithm[J]. Acta Optica Sinica, 2019, 39(4): 0412012
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