• Acta Photonica Sinica
  • Vol. 49, Issue 4, 0412001 (2020)
Xin-jun WAN, Song LÜ, Ke SONG, and Shu-ping XIE
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    DOI: 10.3788/gzxb20204904.0412001 Cite this Article
    Xin-jun WAN, Song LÜ, Ke SONG, Shu-ping XIE. A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution[J]. Acta Photonica Sinica, 2020, 49(4): 0412001 Copy Citation Text show less
    Schematic of stepped mirror 3D measurement system based on fringe reflection step mirror
    Fig. 1. Schematic of stepped mirror 3D measurement system based on fringe reflection step mirror
    Schematic of the reverse propagation ray tracing of the fringe reflection system
    Fig. 2. Schematic of the reverse propagation ray tracing of the fringe reflection system
    Simulation of the reflection ray and phase hop values and the proper structure
    Fig. 3. Simulation of the reflection ray and phase hop values and the proper structure
    Micron-level resolution fringe reflection 3D measurement experimental setup and physical image of the stepped mirror sample to be measured
    Fig. 4. Micron-level resolution fringe reflection 3D measurement experimental setup and physical image of the stepped mirror sample to be measured
    Calibration chessboard and calibration reprojection errors
    Fig. 5. Calibration chessboard and calibration reprojection errors
    Reflection fringe image collected at positions 1 and 2
    Fig. 6. Reflection fringe image collected at positions 1 and 2
    Unwrapped horizontal and vertical phase diagrams
    Fig. 7. Unwrapped horizontal and vertical phase diagrams
    Step mirror 3D measurement result
    Fig. 8. Step mirror 3D measurement result
    Step mirror cross section analysis
    Fig. 9. Step mirror cross section analysis
    Step height measurement results of the test part from a white light interference microscope
    Fig. 10. Step height measurement results of the test part from a white light interference microscope
    Step heightWhite light interference microscope/μmProposed method/μm
    5 μm4.9284.963±0.524
    10 μm9.8939.952±0.416
    Table 1. Measurement results of the step height
    Xin-jun WAN, Song LÜ, Ke SONG, Shu-ping XIE. A Specular Stepped Surface Profile Measurement System Based on Fringe Reflection Principle with Micrometer-level Height Resolution[J]. Acta Photonica Sinica, 2020, 49(4): 0412001
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