[in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Photonica Sinica >Volume 33 >Issue 1 >Page 90 > Article

Acta Photonica Sinica
Vol. 33, Issue 1, 90 (2004)

[in Chinese]

[in Chinese]¹, [in Chinese]², and [in Chinese]¹

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. [J]. Acta Photonica Sinica, 2004, 33(1): 90 Copy Citation Text

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References

[1] Sun Yun, Sun Feng, Zhao Hong,et al.Research on roughness measurement by reflected interference spectrum methods.Interferenceof Optical Test, Hefei, Anhui,2002.307～312

[2] Cheng Duanjun (25 Hopewell Dr. Soney Brook N Y 11790). Optic fiber direct-sensingbio-probe using a phase-tracking approach. U.S patent. Patent Number: 5,804,453. Date ofPatent: Sep.8,1998

[in Chinese], [in Chinese], [in Chinese]. [J]. Acta Photonica Sinica, 2004, 33(1): 90

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