• Acta Optica Sinica
  • Vol. 24, Issue 1, 33 (2004)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Temperature Stability of the Central Wavelength for WDM Thin Film Bandpass Filters[J]. Acta Optica Sinica, 2004, 24(1): 33 Copy Citation Text show less
    References

    [1] Zoller A, Beisswenger S, Gotzelmann R et al.. Plasma ion assisted deposition:a novel technique for the production of optical coatings. Proc. SPIE, 1994, 2253:394~402

    [2] Martin P J, Macleod H A, Netterfield R P et al.. Ion-beam-assisted deposition of thin films. Appl. Opt., 1983, 22(1):178~184

    [3] Waldorf A J, Dobrowolski J A, Sullivan B T et al.. Optical coatings deposited by reactive ion plating. Appl. Opt., 1993, 32(28):5583~5593

    [4] Demiryont H, Sites J R, Geib K. Effects of oxygen content on the properties of tantalum oxide films deposited by ion-beam sputtering. Appl. Opt., 1985, 24(4):490~495

    [5] Takashashi H. Temperature Stability of thin-film narrow-bandpass filters produced by ion-assisted deposition. Appl. Opt., 1995, 34(4):667~675

    [7] Macleod H A. Thin-Film Optical Filters. 2nd ed. Bristol: Adam Hilger Ltd., 1986. 260~265

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Temperature Stability of the Central Wavelength for WDM Thin Film Bandpass Filters[J]. Acta Optica Sinica, 2004, 24(1): 33
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