• Infrared and Laser Engineering
  • Vol. 33, Issue 6, 666 (2004)
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Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Automatic X-ray cephalometric measuring and analysis system[J]. Infrared and Laser Engineering, 2004, 33(6): 666 Copy Citation Text show less

    Abstract

    A system is introduced, which can automatically measure and analyze a cephalogram. This system includes the patient information management module, the landmarking module, the measuring and analysis module, and the inter-active module. Several image processing methods are used in the course of landmarking, such as wavelet multi-scale analysis and Canny filter. A knowledge-based edge-tracing algorithm also is used to detect edges. Landmarks are detected according to the facial anatomy knowledge. The experimental result shows that the system has good performance.